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Metrology and Diagnostic Techniques for Nanoelectronics | 1:a upplagan Reapris

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Artikelnr: SK0093358-SE20260527-055838 Kategori: Etikett:

Beskrivning

Beskrivning

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Om denna bok

Metrology and Diagnostic Techniques for Nanoelectronics av Zhiyong Ma och David G. Seiler är en Inbunden bok med 1454 sidor på Engelska. Detta är den 1:a upplagan som utgavs 2016 av Taylor & Francis Ltd.

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Produktinformation

Kategori:

Naturvetenskap & teknik

Bandtyp:
Inbunden
Språk:
Engelska
ISBN:
9789814745086